Title :
Fast binary matching for edge histogram descriptor
Author :
Byoul Park ; Chee Sun Won
Author_Institution :
Div. of Electron. & Electr. Eng., Dongguk Univ. - Seoul, Seoul, South Korea
Abstract :
Edge histogram descriptor (EHD) consists of histogram bins of local edges in an image. Instead of the conventional bin-to-bin matching for the similarity measure, this paper presents a binary string descriptor for the EHD to achieve a faster binary bit-to-bit matching.
Keywords :
edge detection; image matching; EHD; bin-to-bin matching; binary bit-to-bit matching; edge histogram descriptor; local edges; Hamming distance; MPEG-7; edge histogram descriptor; feature matching;
Conference_Titel :
Consumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
Conference_Location :
JeJu Island
DOI :
10.1109/ISCE.2014.6884396
