• DocumentCode
    1790350
  • Title

    Ultra low capacitance bidirectional transient voltage suppression device for the protection high speed data line from electrostatic discharge shocks

  • Author

    Bouangeune, Daoheung ; Young Joo Song ; Vilathong, Sengchanh ; Sang-Sik Choi ; Deok-Ho Cho ; Chel-Jong Choi ; Kyu-Hwan Shim

  • Author_Institution
    Factuly of Sci., Nat. Univ. of Laos, Vientiane, Laos
  • fYear
    2014
  • fDate
    22-25 June 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    New ultra low capacitance bidirectional transient voltage suppression (Bi-TVS) devices consist of two parallel unidirectional TVS devices facing opposite directions, have been fabricated for electrostatic discharge (ESD) protection applications. The reduced pressure chemical vapor deposition (RPCVD) technology allows growing uniform thin Si films with various doping conditions and thicknesses of a PIN and TVS diode in one die. This result in a small turn on dynamic resistance of ~0.7 Ω and leakage current below 10-9 A. The employing PIN diode was effective in reducing the capacitance that suppressed down to ~0.6 pF and in leading to the wide signal band pass over 3 GHz. The fabricated Bi-TVS device was capability handled the IEC 610004-2 peak voltage and TLP current in exceeding ±29 kV and ±30 A. The research results guarantee that the new proposed TVS device is very effective in protecting high speed data line against strong and rapid ESD attacks.
  • Keywords
    IEC standards; chemical vapour deposition; electrostatic discharge; p-i-n diodes; semiconductor doping; IEC 610004-2 standard; PIN diode; TVS diode; electrostatic discharge shocks; high speed data line protection; leakage current; parallel unidirectional TVS devices; reduced pressure chemical vapor deposition technology; transient voltage suppression diode; ultralow capacitance bidirectional transient voltage suppression device; Capacitance; Electrostatic discharges; Leakage currents; PIN photodiodes; Performance evaluation; Semiconductor diodes; Temperature measurement; Bidirectional; ESD; HBM; IEC 61000-4-2; TLP; TVS diode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
  • Conference_Location
    JeJu Island
  • Type

    conf

  • DOI
    10.1109/ISCE.2014.6884398
  • Filename
    6884398