Title :
Adapted sinogram interpolation in computer tomographic images
Author :
Eun-Ju Lee ; Kyung-Chan Jin
Author_Institution :
Manuf. Syst. R&BD Group, KITECH, Cheonan, South Korea
Abstract :
In this paper, a limited-view computer tomography(CT) image reconstruction method was proposed to reduce the scan times and X-ray dose in the semiconductor industry. To reduce streak artifacts, which are caused by an insufficient number of views, we studied an adapted sinogram interpolation method based on the average pixel value. We used the characteristics of the neighboring views for an adapted linear interpolation. The change patterns were tracked by iteratively averaging the values. Next, we added a weight in accordance with the gradient. A Shepp-Logan phantom was used to evaluate the effectiveness of the proposed interpolation method. The results showed that the streak artifacts were reduced in the adapted interpolation method. In addition, we compared our method with the linear interpolation method by using the Peak-Signal-to-Noise Ratio(PSNR).
Keywords :
image reconstruction; interpolation; semiconductor industry; PSNR; Shepp-Logan phantom; X-ray dose; adapted linear interpolation; average pixel value; computer tomographic images; image reconstruction; peak-signal-to-noise ratio; semiconductor industry; sinogram interpolation; Computed tomography; Computers; Image reconstruction; Interpolation; PSNR; Phantoms; Transforms; Computer Tomography; Projection; Sinogram Interpolation;
Conference_Titel :
Consumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
Conference_Location :
JeJu Island
DOI :
10.1109/ISCE.2014.6884457