Title :
Non-destructive threshold assessment of a pinned photo diode pixel with correlated double sampling
Author :
Guidash, Michael ; Vogelsang, Thomas
Author_Institution :
Rambus Inc., Sunnyvale, CA, USA
Abstract :
This paper presents a pixel architecture and method of operation that enables a non-destructive assessment of the charge collected in a pinned photo diode pixel with transfer gate. The proposed architecture allows both true correlated double sampling for low noise at low light and per-pixel control of oversampling to increase the dynamic range of small pixels with limited full well capacity.
Keywords :
CMOS image sensors; nondestructive testing; photodiodes; CMOS image sensor technology; correlated double sampling; nondestructive threshold assessment; pinned photodiode pixel; transfer gate; Dynamic range; Electric potential; Image sensors; Lighting; Logic gates; Noise; Sensors; correlated double sampling; digital imaging; high dynamic range; image sensor; oversampling;
Conference_Titel :
Consumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
Conference_Location :
JeJu Island
DOI :
10.1109/ISCE.2014.6884513
