A compressive sensing approach to NDE/NDT

Author

Moriyama, Takumi ; Poli, Lorenzo ; Anselmi, Nicola ; Oliveri, G. ; Ping-Ping Ding

Author_Institution

Dept. of Electr. & Electron. Eng., Univ. of Nagasaki, Nagasaki, Japan

fYear

2014

fDate

16-19 Nov. 2014

Firstpage

1

Lastpage

3

Abstract

This paper presents an innovative microwave imaging technique for detecting defects in dielectric or conductive media developed through the Bayesian Compressive Sensing theory. Thanks to the a-priori knowledge of the medium unaffected by defects, the inversion problem is formulated as the estimation of the sparse differential equivalent currents within the support of the defects. The strategy has been developed in a multi-task implementation in order to efficiently handle the information provided by the scattered data.

Keywords

Bayes methods; compressed sensing; dielectric devices; inverse problems; microwave imaging; nondestructive testing; Bayesian compressive sensing theory; NDE; NDT; a-priori knowledge; conductive media; defect detection; dielectric media; innovative microwave imaging technique; inversion problem; nondestructive evaluation; nondestructive testing; sparse differential equivalent current estimation; Bayes methods; Compressed sensing; Image reconstruction; Inverse problems; Microwave imaging; Microwave theory and techniques;

fLanguage

English

Publisher

ieee

Conference_Titel

Antenna Measurements & Applications (CAMA), 2014 IEEE Conference on

Conference_Location

Antibes Juan-les-Pins

Type

conf

DOI

10.1109/CAMA.2014.7003340

Filename

7003340