Title :
Direct and iterative inverse wave scattering methods for time-harmonic far-field profilometry
Author :
Alwakil, A. ; Soriano, G. ; Belkebir, K. ; Giovannini, H. ; Arhab, S.
Author_Institution :
Inst. Fresnel, Aix-Marseille Univ., Marseille, France
Abstract :
A direct inversion method and two iterative schemes based on a numerical solution of the rigorous forward surface scattering problem are tested and compared for the profilometry of a very rough metallic surface in a context of sparse data.
Keywords :
electric field measurement; electromagnetic wave scattering; harmonic analysis; inverse problems; iterative methods; magnetic field measurement; direct inverse wave scattering method; direct inversion method; forward surface scattering problem; iterative inverse wave scattering method; iterative schemes; sparse data; time-harmonic far-field profilometry; very rough metallic surface profilometry; Approximation methods; Electromagnetic scattering; Optical surface waves; Rough surfaces; Surface roughness; Surface waves;
Conference_Titel :
Antenna Measurements & Applications (CAMA), 2014 IEEE Conference on
Conference_Location :
Antibes Juan-les-Pins
DOI :
10.1109/CAMA.2014.7003384
