Title :
Laser-induced fault effects in security-dedicated circuits
Author :
Leveugle, R. ; Maistri, P. ; Vanhauwaert, P. ; Lu, Feng ; Di Natale, G. ; Flottes, M.-L. ; Rouzeyre, B. ; Papadimitriou, A. ; Hely, D. ; Beroulle, V. ; Hubert, Guillaume ; De Castro, S. ; Dutertre, J.-M. ; Sarafianos, A. ; Boher, N. ; Lisart, M. ; Damiens
Author_Institution :
TIMA, Univ. Grenoble Alpes, Grenoble, France
Abstract :
Lasers have become one of the most efficient means to attack secure integrated systems. Actual faults or errors induced in the system depend on many parameters, including the circuit technology and the laser characteristics. Understanding the physical effects is mandatory to correctly evaluate during the design flow the potential consequences of a laser-based attack and implement efficient counter-measures. This paper presents results obtained within the LIESSE project, aiming at defining a comprehensive approach for designers. Outcomes include the definition of fault/error models at several levels of abstraction, specific CAD tools using these models and new counter-measures well-suited to thwart laser-based attacks. Actual measures on components manufactured in the new 28 nm FDSOI technology are also presented.
Keywords :
CAD; lasers; network synthesis; silicon-on-insulator; CAD tools; FDSOI technology; LIESSE project; abstraction; circuit technology; counter-measures; design flow; error models; fault models; laser characteristics; laser-induced fault effects; physical effects; security-dedicated circuits; size 28 nm; thwart laser-based attacks; Analytical models; Circuit faults; Integrated circuit modeling; Laser modes; Measurement by laser beam; Semiconductor lasers; Solid modeling; Counter-measures; Fault attacks; Fault models; Hardware security; Lasers; Security evaluation;
Conference_Titel :
Very Large Scale Integration (VLSI-SoC), 2014 22nd International Conference on
Conference_Location :
Playa del Carmen
DOI :
10.1109/VLSI-SoC.2014.7004184
