Title :
Characterization and Analyses of RadHard-By-Design CMOS Open Drain Quad Comparators
Author :
Benson, Ray ; Resch, Paul ; Milanowski, Randall ; Swonger, James
Author_Institution :
Aeroflex Microelectric Solutions - HiRel, Plainview, NY, USA
Abstract :
We provide characterization data for Total Ionizing Dose and Single Event effects on a radiation hardened by design quad CMOS comparator. We also present selected results of SPICE simulation analyses of single event transient response.
Keywords :
CMOS analogue integrated circuits; comparators (circuits); integrated circuit design; radiation hardening (electronics); RadHard-by-design CMOS open drain quad comparators; SPICE simulation analyses; characterization data; radiation hardening; single event effects; single event transient response; total ionizing dose; CMOS integrated circuits; Electronic mail; Radiation effects; SPICE; Testing; Transient analysis; Voltage measurement;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004555
