Author :
Oser, P. ; Spiezia, G. ; Brugger, M. ; Danzeca, S. ; Fadakis, E. ; Foucard, G. ; Garcia Alia, R. ; Losito, R. ; Masi, A. ; Mekki, J. ; Peronnard, P. ; Ruggiero, G. ; Secondo, R. ; Stachyra, K. ; Gaillard, R.
Abstract :
In the context of the CERN ´Radiation To Electronics (R2E)´ project, the vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analysed. The tested parts include analog, linear, digital, and hybrid devices and a summary of radiation test results is provided in this paper.
