Title :
Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA
Author :
LaBel, Kenneth A. ; O´Bryan, Martha V. ; Dakai Chen ; Campola, Michael J. ; Casey, Megan C. ; Pellish, Jonathan A. ; Lauenstein, Jean-Marie ; Wilcox, Edward P. ; Topper, Alyson D. ; Ladbury, Raymond L. ; Berg, Melanie D. ; Gigliuto, Robert A. ; Boutte, Al
Author_Institution :
NASA/GSFC, Greenbelt, MD, USA
Abstract :
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects (SEE), proton-induced displacement damage (DD), and total ionizing dose (TID). This paper is a summary of test results.
Keywords :
radiation hardening (electronics); semiconductor device testing; space vehicle electronics; NASA; TID; candidate spacecraft electronics; displacement damage; heavy ion induced SEE; national aeronautics and space administration; proton-induced DD; radiation effect; single event effect; total ionizing dose; CMOS integrated circuits; Protons; Schottky diodes; Silicon; Testing; Voltage measurement; Xenon;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004560
