Title :
Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers
Author :
Irom, Farokh ; Agarwal, Shri G. ; Amrbar, Mehran
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This compendium reports on single-event latchup and total ionizing dose results for a variety of operational amplifiers targeted for possible use in NASA spacecraft. It covers devices tested over the last 15 years.
Keywords :
operational amplifiers; radiation hardening (electronics); NASA spacecraft; commercial operational amplifiers; compendium reports; radiation tolerant operational amplifiers; single-event latchup; total ionizing dose test; Conferences; Degradation; Laboratories; Operational amplifiers; Performance evaluation; Radiation effects; Temperature measurement;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004561
