DocumentCode :
1791914
Title :
Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation
Author :
Kessarinskiy, Leonid N. ; Boychenko, Dmitry V. ; Petrov, Andrey G. ; Nekrasov, Pavel V. ; Sogoyan, Armen V. ; Anashin, Vasily S. ; Chubunov, Pavel A.
Author_Institution :
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
fYear :
2014
fDate :
14-18 July 2014
Firstpage :
1
Lastpage :
3
Abstract :
Compendium of TID comparative results under X-ray, Gamma and LINAC irradiation is presented. The new joint method of X-ray and gamma irradiation employment for TID investigations is proposed. Experiment results successfully confirm the validity of the proposed TID testing approach.
Keywords :
X-ray effects; gamma-ray effects; radiation hardening (electronics); LINAC irradiation; TID comparative compendium; TID testing approach; X-ray irradiation; gamma irradiation; Calibration; Employment; Integrated circuits; Joints; Radiation effects; Testing; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
Type :
conf
DOI :
10.1109/REDW.2014.7004562
Filename :
7004562
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1791914
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