DocumentCode :
1791915
Title :
Design and Radiation Hardness of Next Generation Solar UV Radiometers
Author :
Gissot, Samuel ; BenMoussa, Ali ; Giordanengo, Boris ; Soltani, Ali ; Saito, Takashi ; Schuhle, Udo ; Kroth, Udo ; Gottwald, Alexander
Author_Institution :
R. Obs. of Belgium (ROB), Brussels, Belgium
fYear :
2014
fDate :
14-18 July 2014
Firstpage :
1
Lastpage :
6
Abstract :
For next space-based ultraviolet (UV) solar radiometers, we propose a design based on subsystem components that are selected according to lessons learned from previous flying missions and ground irradiation campaigns. UV interference filters inherited from space-based solar missions show strong degradation caused by structural changes that lead to an important decrease of visible light rejection. Wide bandgap semiconductors (WBGS) are used for the photodetectors: innovative metal-semiconductor-metal (MSM) based on Aluminum Nitride (AlN) and Diamond-based PIN photodetectors were developed, characterized and compared to the commonly used silicon photodiode technology (AXUV and SXUV types). Insignificant degradation of the WBGS based-photodetector performances were observed after exposure to protons of 14.4 MeV energy showing a good radiation tolerance up to fluences of 1x10^11 p+/cm2. Onboard calibration strategy based on UV LEDs are used as well to distinguish the detector´s drift from inevitable degradations of the optical front filters.
Keywords :
aluminium compounds; calibration; metal-semiconductor-metal structures; optical filters; p-i-n diodes; photodetectors; radiation hardening (electronics); radioastronomy; radiometers; wide band gap semiconductors; UV LED; WBGS based-photodetector; aluminum nitride; calibration strategy; diamond-based PIN photodetectors; electron volt energy 14.4 MeV; flying mission; ground irradiation campaigns; metal-semiconductor-metal; next generation solar UV radiometers; optical front filters; radiation hardness; silicon photodiode technology; space-based solar mission; space-based ultraviolet solar radiometers; subsystem components; ultraviolet interference filters; visible light rejection; widebandgap semiconductors; Light emitting diodes; Optical filters; Photodiodes; Protons; Radiation effects; Radiometers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
Type :
conf
DOI :
10.1109/REDW.2014.7004563
Filename :
7004563
Link To Document :
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