Title :
ELDRS Characterization of Texas Instruments LM185, 1.2V Precision Reference: Retrograde Behavior Demonstrates Why Taking Interim Test Points Is Important
Author :
Kruckmeyer, Kirby ; Thang Trinh
Author_Institution :
Texas Instrum., Santa Clara, CA, USA
Abstract :
The LM185 1.2V reference voltage degraded through total ionizing dose radiation, but began to recover at around 70 krad. The recovery curve was different for high and low dose rates and biased and unbiased test conditions.
Keywords :
radiation hardening (electronics); testing; ELDRS characterization; LM185 reference voltage; Texas Instruments LM185 precision reference; biased test conditions; enhanced low dose rate sensitivity characterization; high dose rates; interim test points; low dose rates; recovery curve; retrograde behavior; total ionizing dose radiation; unbiased test conditions; voltage 1.2 V; Breakdown voltage; Military standards; Radiation effects; Temperature distribution; Test facilities; Voltage measurement;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004567
