Title :
First Successful SEE Measurements with Heavy Ions in Brazil
Author :
Medina, N.H. ; Silveira, M.A.G. ; Added, N. ; Aguiar, V.A.P. ; Giacomini, Renato ; Macchione, E.L.A. ; de Melo, M.A.A. ; Santos, R.B.B. ; Seixas, L.E.
Author_Institution :
Inst. de Fis. da Univ. de Sao Paulo, Sao Paulo, Brazil
Abstract :
In this work, the first successful SEE measurements with heavy ions in Brazil is reported. The heavy ions were produced at the São Paulo 8 UD Pelletron accelerator. 12C, 16O, 19F, 28Si, 35Cl, 63Cu and 107Ag heavy ion beams were used to test a commercial off-the-shelf transistor. During irradiation, the response of a pMOS transistor was continuously monitored to measure the SEE events. In order to achieve a uniform low intensity beam the heavy ions were Rutherford scattered at 150 by a 275 μg/cm2 gold foil.
Keywords :
MOSFET; Rutherford backscattering; carbon; chlorine; copper; fluorine; ion accelerators; ion beams; oxygen; radiation hardening (electronics); semiconductor device testing; silicon; silver; two-dimensional hole gas; Ag; Brazil; C; Cl; Cu; F; O; Rutherford scattering; SEE measurement; São Paulo 8 UD Pelletron accelerator; Si; gold foil; heavy ion beam; irradiation; off-the-shelf transistor testing; pMOS transistor; single event effect; Ion beams; Ions; MOSFET; Radiation effects; Scattering; Silicon;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004571
