Title :
Low Energy Protons at RADEF - Application to Advanced eSRAMs
Author :
Kettunen, Heikki ; Ferlet-Cavrois, Veronique ; Roche, Philippe ; Rossi, Mattia ; Bosser, Alexandre ; Gasiot, Gilles ; Guerre, Francois-Xavier ; Jaatinen, Jukka ; Javanainen, Arto ; Lochon, Frederic ; Virtanen, Ari
Author_Institution :
Dept. of Phys., Univ. of Jyvaskyla., Jyvaskyla, Finland
Abstract :
A low energy proton facility has been developed at RADEF, Jyv̈skyl̈, Finland. The proton energy selection, calibration and dosimetry are described. The first experiment with external users was performed using two memory test vehicles fabricated with 28 nm technology. Examples of single event upset measurements in the test vehicles embedded SRAMs (eSRAMs) as a function of proton energy are provided.
Keywords :
SRAM chips; calibration; dosimetry; radiation hardening (electronics); RADEF; calibration; dosimetry; eSRAM; embedded SRAM; external users; low energy proton facility; memory test vehicles; proton energy selection; single event upset measurements; size 28 nm; test vehicles; Atmospheric measurements; Calibration; Detectors; Magnetic flux; Magnetic separation; Particle beams; Protons;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004577