• DocumentCode
    1791944
  • Title

    Mirage: A New Proton Facility for the Study of Direct Ionization in Sub-100nm Technologies

  • Author

    Duzellier, S. ; Hubert, Guillaume ; Rey, R. ; Bezerra, F.

  • Author_Institution
    ONERA, Toulouse, France
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A new proton beam line has been developed at ONERA for investigating radiation effects in electronics. Standard beams are used for studying cumulated effects in optoelectronics and photonics, low current configuration has been developed for studying direct ionization effects in advanced digital technologies.
  • Keywords
    integrated optics; proton beams; radiation effects; Mirage; ONERA; advanced digital technology; direct ionization effect; optoelectronics; photonics; proton beam line; proton facility; radiation effect; Current measurement; Ionization; PIN photodiodes; Particle beams; Protons; Silicon; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004578
  • Filename
    7004578
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791944