DocumentCode
1791964
Title
SEE Test Results for P2020 and P5020 Freescale Processors
Author
Guertin, Steven M. ; Amrbar, Mehran
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear
2014
fDate
14-18 July 2014
Firstpage
1
Lastpage
7
Abstract
Freescale processors are tested for heavy ion and proton SEE. The P2020 is tested for cache and register bit upsets as well as for upsets of various algorithms and memory controller upsets. The P5020 is tested for cache and register bit upsets as well as memory controller upsets. Effectiveness of testing various algorithms is limited to proton testing of the P2020 and is generally limited in fidelity due to register and cache upsets.
Keywords
radiation hardening (electronics); P2020; P5020; SEE test results; cache upsets; freescale processors; heavy ion; memory controller upsets; proton testing; register bit upsets; Computer crashes; Program processors; Protons; Registers; Sensitivity; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location
Paris
Print_ISBN
978-1-4799-5883-2
Type
conf
DOI
10.1109/REDW.2014.7004587
Filename
7004587
Link To Document