Title :
SEE Test Results for P2020 and P5020 Freescale Processors
Author :
Guertin, Steven M. ; Amrbar, Mehran
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Freescale processors are tested for heavy ion and proton SEE. The P2020 is tested for cache and register bit upsets as well as for upsets of various algorithms and memory controller upsets. The P5020 is tested for cache and register bit upsets as well as memory controller upsets. Effectiveness of testing various algorithms is limited to proton testing of the P2020 and is generally limited in fidelity due to register and cache upsets.
Keywords :
radiation hardening (electronics); P2020; P5020; SEE test results; cache upsets; freescale processors; heavy ion; memory controller upsets; proton testing; register bit upsets; Computer crashes; Program processors; Protons; Registers; Sensitivity; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004587
