Title :
SEE Testing Results for RF and Microwave ICs
Author :
Chukov, George V. ; Elesin, Vadim V. ; Nazarova, Galina N. ; Nikiforov, Alexander Y. ; Boychenko, Dmitry V. ; Telets, Vitaliy A. ; Kuznetsov, Alexander G. ; Amburkin, Konstantin M.
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
A short overview of single event effects for a variety of RF and microwave ICs is presented. New results obtained at the SPELS test center have been used along with published data.
Keywords :
integrated circuit design; microwave integrated circuits; radiation hardening (electronics); RF integrated circuits; SEE testing results; SPELS test center; microwave IC; single event effects; CMOS integrated circuits; Microwave FET integrated circuits; Microwave amplifiers; Microwave circuits; Microwave integrated circuits; Microwave oscillators; Radiation effects;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004589
