Title :
Single-Event Effects in Low-Cost, Low-Power Microprocessors
Author :
Quinn, Heather ; Fairbanks, Tom ; Tripp, Justin L. ; Duran, George ; Lopez, B.
Author_Institution :
Los Alamos Nat. Lab., Los Alamos, NM, USA
Abstract :
ARMs and microcontrollers are low-cost, low-power microprocessors that are frequently used in embedded computing. While not immune to the naturally occurring radiation environment in space, these microprocessors can be worthwhile replacements for space-grade microprocessors for non-mission-critical computational tasks. In this paper results from radiation testing for several available ARMs and microcontrollers are presented.
Keywords :
integrated circuit testing; low-power electronics; microcontrollers; radiation hardening (electronics); space vehicle electronics; ARMs; embedded computing; low-cost low-power microprocessors; microcontrollers; nonmission-critical computational tasks; radiation environment; radiation testing; single-event effects; space-grade microprocessors; Computer architecture; Microprocessors; Neutrons; Nonvolatile memory; Program processors; Random access memory;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004596
