Title :
The Behavior of SEE Sensitivity at Various TID Levels
Author :
Novikov, Alexander A. ; Pechenkin, Alexander A. ; Chumakov, Alexander I.
Author_Institution :
Nat. Res. Nucl. Univ. (NRNU MEPhI), Moscow, Russia
Abstract :
SEU, SEL and SET sensitivity estimation results using laser technique in dependency of TID effects are presented and discussed.
Keywords :
radiation hardening (electronics); sensitivity analysis; SEE; SEL; SET; SEU; TID levels; laser technique; sensitivity behavior; single event effects; single event transient; single event upset; CMOS integrated circuits; Measurement by laser beam; Radiation effects; Random access memory; Semiconductor lasers; Sensitivity; X-ray lasers;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004599
