• DocumentCode
    1791998
  • Title

    Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References

  • Author

    van Vonno, N.W. ; Williams, Barry ; Turner, S.D. ; Thomson, E.J. ; Bernard, S.K. ; Goodhew, D.N.

  • Author_Institution
    Precision Products, Intersil Corp., Palm Bay, FL, USA
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL71090SEH and ISL71091SEH hardened voltage references together with a discussion of electrical specifications and fabrication process.
  • Keywords
    circuit testing; radiation hardening (electronics); reference circuits; ISL71091SEH precision voltage references; Intersil ISL71090SEH; SEE; electrical specifications; fabrication process; hardened voltage references; high dose rate total dose testing; single event effects testing; total dose effects testing; Accuracy; Annealing; Noise; Performance evaluation; Pins; Radiation effects; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004604
  • Filename
    7004604
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791998