Title :
Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References
Author :
van Vonno, N.W. ; Williams, Barry ; Turner, S.D. ; Thomson, E.J. ; Bernard, S.K. ; Goodhew, D.N.
Author_Institution :
Precision Products, Intersil Corp., Palm Bay, FL, USA
Abstract :
We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL71090SEH and ISL71091SEH hardened voltage references together with a discussion of electrical specifications and fabrication process.
Keywords :
circuit testing; radiation hardening (electronics); reference circuits; ISL71091SEH precision voltage references; Intersil ISL71090SEH; SEE; electrical specifications; fabrication process; hardened voltage references; high dose rate total dose testing; single event effects testing; total dose effects testing; Accuracy; Annealing; Noise; Performance evaluation; Pins; Radiation effects; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004604
