Title :
Total Ionizing Dose Effects on Commercial Electronics for Cube Sats in Low Earth Orbits
Author :
Netzer, Richard ; Avery, Keith ; Kemp, William ; Vera, Alonzo ; Zufelt, Brian ; Alexander, David
Author_Institution :
Air Force Res. Lab., Kirtland AFB, NM, USA
Abstract :
Modest total dose in low earth orbit and short cube sat missions provide an opportunity for using commercial electronics. We present the results of high and low dose rate testing of candidate commercial microcircuits.
Keywords :
artificial satellites; integrated circuits; candidate commercial microcircuits; commercial electronics; high dose rate testing; low dose rate testing; low earth orbits; short cube sat missions; total ionizing dose effects; Bones; CMOS integrated circuits; Microcontrollers; Operational amplifiers; Performance evaluation; Ports (Computers); Radiation effects;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004607
