• DocumentCode
    1792004
  • Title

    Total Ionizing Dose Effects on Commercial Electronics for Cube Sats in Low Earth Orbits

  • Author

    Netzer, Richard ; Avery, Keith ; Kemp, William ; Vera, Alonzo ; Zufelt, Brian ; Alexander, David

  • Author_Institution
    Air Force Res. Lab., Kirtland AFB, NM, USA
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Modest total dose in low earth orbit and short cube sat missions provide an opportunity for using commercial electronics. We present the results of high and low dose rate testing of candidate commercial microcircuits.
  • Keywords
    artificial satellites; integrated circuits; candidate commercial microcircuits; commercial electronics; high dose rate testing; low dose rate testing; low earth orbits; short cube sat missions; total ionizing dose effects; Bones; CMOS integrated circuits; Microcontrollers; Operational amplifiers; Performance evaluation; Ports (Computers); Radiation effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004607
  • Filename
    7004607
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1792004