• DocumentCode
    1792421
  • Title

    Curvilinear property measurement and computation methods for physical verification of bent waveguides in photonic integrated circuit layouts

  • Author

    Ruping Cao ; Couder, Lionel ; Cayo, J. ; Ferguson, John ; Pikus, F. ; Arriordaz, Alexandre ; O´Connor, Ian

  • Author_Institution
    Mentor Graphics Corp., Mentor, OH, USA
  • fYear
    2014
  • fDate
    4-7 May 2014
  • Firstpage
    35
  • Lastpage
    36
  • Abstract
    We discuss why electronic design automation tools need new functionality to perform curvilinear layout feature validation of photonic integrated circuits. We evaluate and test different algorithms for curvilinear path length and curvature measurement.
  • Keywords
    curvature measurement; integrated optics; length measurement; optical design techniques; optical waveguides; bent waveguides; computation methods; curvilinear measurement; curvilinear path length measurement; electronic design automation tools; photonic integrated circuit layouts; Accuracy; Algorithm design and analysis; Approximation algorithms; Approximation methods; Current measurement; Estimation; Layout;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Interconnects Conference, 2014 IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4799-2467-7
  • Type

    conf

  • DOI
    10.1109/OIC.2014.6886066
  • Filename
    6886066
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1792421