Title :
Curvilinear property measurement and computation methods for physical verification of bent waveguides in photonic integrated circuit layouts
Author :
Ruping Cao ; Couder, Lionel ; Cayo, J. ; Ferguson, John ; Pikus, F. ; Arriordaz, Alexandre ; O´Connor, Ian
Author_Institution :
Mentor Graphics Corp., Mentor, OH, USA
Abstract :
We discuss why electronic design automation tools need new functionality to perform curvilinear layout feature validation of photonic integrated circuits. We evaluate and test different algorithms for curvilinear path length and curvature measurement.
Keywords :
curvature measurement; integrated optics; length measurement; optical design techniques; optical waveguides; bent waveguides; computation methods; curvilinear measurement; curvilinear path length measurement; electronic design automation tools; photonic integrated circuit layouts; Accuracy; Algorithm design and analysis; Approximation algorithms; Approximation methods; Current measurement; Estimation; Layout;
Conference_Titel :
Optical Interconnects Conference, 2014 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4799-2467-7
DOI :
10.1109/OIC.2014.6886066
