• DocumentCode
    1792612
  • Title

    The effect of Cu particle additions on the microstructure and melting point of Sn-Bi solder for die attachment

  • Author

    Mokhtari, O. ; Nishikawa, Hisashi

  • Author_Institution
    Joining & Welding Res. Inst., Osaka Univ., Ibaraki, Japan
  • fYear
    2014
  • fDate
    15-16 July 2014
  • Firstpage
    43
  • Lastpage
    43
  • Abstract
    This study aims to produce high temperature joints by using relatively low processing temperature eutectic Sn-Bi solder. By the addition of 30 mass %Cu particles to the eutectic Sn-Bi solder, this research produces a new in-situ phase with a higher remelting point. The microstructure of eutectic Sn-Bi and Sn-Bi with Cu particles addition were investigated where added Cu particles converted almost all Sn phase to new phases. The microstructure analysis shows that increasing the heat input accelerates the reaction between Sn phase and Cu particles. The differential scanning calorimetry (DSC), scanning electron microscopy (SEM) and electron probe microanalyzer (EPMA) proved that almost all Sn phases is converted to new phases resulting in a higher melting point.
  • Keywords
    alloying additions; bismuth alloys; copper alloys; differential scanning calorimetry; electron probe analysis; eutectic alloys; eutectic structure; integrated circuit interconnections; melting point; microassembling; scanning electron microscopy; solders; three-dimensional integrated circuits; tin alloys; SnBiCu; copper particle additions; die attachment; differential scanning calorimetry; electron probe microanalyzer; high temperature joints; low processing temperature eutectic solder; melting point; microstructure analysis; scanning electron microscopy; Heating; Joints; Materials; Microelectronics; Microstructure; Scanning electron microscopy; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Temperature Bonding for 3D Integration (LTB-3D), 2014 4th IEEE International Workshop on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4799-5260-1
  • Type

    conf

  • DOI
    10.1109/LTB-3D.2014.6886182
  • Filename
    6886182