Title :
PbS doped silicate glasses for radiation control in near IR lasers: Optical and structural characterization
Author :
Onushchenko, A.A. ; Golubkov, V.V. ; Kalmykov, A.E. ; Staselko, D.I.
Author_Institution :
NITIOM S.I .Vavilov State Opt. Inst., St. Petersburg, Russia
fDate :
June 30 2014-July 4 2014
Abstract :
Structural regularities of lead sulfide doped glasses containing narrow gap PbS nanocrystals have been studied. The precipitation of the semiconductor phase is confirmed by X-ray diffraction data. Angular dependencies of SAXS intensity of the studied samples as well as their TEM images clearly show formation of nearly monodisperse ensemble of PbS nanocrystals.
Keywords :
IV-VI semiconductors; X-ray diffraction; X-ray scattering; lead compounds; nanostructured materials; optical glass; precipitation (physical chemistry); silicon compounds; solid lasers; transmission electron microscopy; PbS doped silicate glasses; PbS-SiO2; SAXS intensity; TEM images; X-ray diffraction; angular dependencies; monodisperse ensemble; narrow gap PbS nanocrystals; near IR lasers; precipitation; radiation control; semiconductor phase; structural regularities; Glass; Nanocrystals; Optical diffraction; Optical fibers; Optical imaging; PbS doped slicate glasses; PbS nanocrystals (NCs); low NCs size dispersion; structural characterization;
Conference_Titel :
Laser Optics, 2014 International Conference
Conference_Location :
Saint Petersburg
Print_ISBN :
978-1-4799-3884-1
DOI :
10.1109/LO.2014.6886207
