DocumentCode :
1793131
Title :
HF-UHF pulse shaping for testing high-speed circuits
Author :
Nikonova, Galina V.
Author_Institution :
Omsk State Tech. Univ., Omsk, Russia
fYear :
2014
fDate :
11-13 Nov. 2014
Firstpage :
1
Lastpage :
4
Abstract :
The paper discloses a method of construction and the results of examining of the ultra wideband pulse signals shaping device designed for testing integrated circuits. The paper analyses the devices with linear and nonlinear transformations of the amplitude and phase signal spectrum. Phase method for defining the parameters of the pulse signal is proposed. A shaper on a powerful GaAs current switch is experimentally tested over the front duration and maximum frequency, limits of regulation and the error of assignment of pulse levels.
Keywords :
gallium arsenide; integrated circuit testing; pulse shaping circuits; GaAs; HF-UHF pulse shaping; amplitude signal spectrum; current switch; integrated circuit testing; linear transformations; nonlinear transformations; phase signal spectrum; pulse levels; ultrawideband pulse signal shaping device; Gallium arsenide; Integrated circuits; Resistance; Switches; Switching circuits; Testing; Transistors; functional testing; phase method; pulse parameters; signal spectrum; switching unit; ultra wideband signal;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dynamics of Systems, Mechanisms and Machines (Dynamics), 2014
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-6406-2
Type :
conf
DOI :
10.1109/Dynamics.2014.7005688
Filename :
7005688
Link To Document :
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