• DocumentCode
    1794063
  • Title

    Experimental study on dielectric properties of yeast cells in micro channel by impedance spectroscopy

  • Author

    Jiafeng Yao ; Kodera, Tatsuya ; Sapkota, Archana ; Obara, Hiromichi ; Takei, Manabu

  • Author_Institution
    Grad. Sch. of Mech. Eng., Chiba Univ., Chiba, Japan
  • fYear
    2014
  • fDate
    10-12 Nov. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Impedance spectroscopy has been proved to be a useful technique for analyzing heterogeneous systems, especially biological cell suspensions and tissues because of its capacity of non-invasive measurement. In the present paper, experiments were conducted to study the dielectric properties of yeast cells by Impedance Spectroscopy. The capacitance of the suspension of yeast cells was measured and the relative permittivity and the dielectric loss were calculated. As the concentration of yeast cells increased, the relative permittivity and the dielectric loss were also increased. In addition, the relative permittivity and the dielectric loss of living cells were higher than that of the dead ones. Finally, we concluded that it is possible to sense the status and the concentration of cell suspension by impedance spectroscopy.
  • Keywords
    bioMEMS; bioelectric phenomena; capacitance measurement; cellular biophysics; dielectric losses; electrochemical impedance spectroscopy; microchannel flow; microorganisms; permittivity; suspensions; biological cell suspensions; biological tissues; dielectric loss; dielectric properties; heterogeneous systems; impedance spectroscopy; living cells; microchannel; noninvasive measurement; relative permittivity; suspension capacitance; yeast cell concentration; Dielectrics; Electrodes; Impedance; Microchannels; Permittivity; Spectroscopy; Suspensions; Dielectric; Impedance Spectroscopy; Multi-layered Microchannel; Yeast;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro-NanoMechatronics and Human Science (MHS), 2014 International Symposium on
  • Conference_Location
    Nagoya
  • Print_ISBN
    978-1-4799-6678-3
  • Type

    conf

  • DOI
    10.1109/MHS.2014.7006168
  • Filename
    7006168