• DocumentCode
    1794825
  • Title

    Evaluation of long time stability of solder joints on Ag thick film conductors on Al2O3

  • Author

    Gierth, Paul ; Zieschank, Michael ; Rebenklau, Lars

  • Author_Institution
    Fraunhofer Inst. for Ceramic Technol. & Syst. IKTS, Dresden, Germany
  • fYear
    2014
  • fDate
    7-11 May 2014
  • Firstpage
    137
  • Lastpage
    142
  • Abstract
    The long time stability of solder joints on Ag-based thick film pastes has been studied. Therefore shear strength, electrical resistance, temperature coefficient of resistance (TCR), optical inspections of solder surface and cross section analyses have been performed. Samples of 1206 and 0805 SMD-components mounted with SnAgCu, SnPbAg, SnBi and SnCu on Ag/Pd or Ag/Pt conductors were prepared. To detect the influence of intermetallic phase growth, high temperature storage according JESD22-A103C at 150°C (125°C for SnBi-solder) up to 500 h has been applied. Shear fatigue life of the interconnection joints was studied with temperature cycling according JESD22-A104D between +125°C/-40°C for up to 1000 cycles. Differences in shear fatigue and electrical characteristics will be evaluated and discussed.
  • Keywords
    ageing; bismuth alloys; copper alloys; electric resistance; fatigue; lead alloys; palladium alloys; platinum alloys; silver alloys; solders; surface mount technology; tin alloys; Ag-Pd; Ag-Pt; Al2O3; JESD22-A103C; SMD component; SnAgCu; SnBi; SnCu; SnPbAg; cross section analysis; electrical resistance; interconnection joints; intermetallic phase growth; shear fatigue life; shear strength; solder joint long time stability; solder surface optical inspections; temperature coefficient of resistance; thick film conductor; thick film paste; Force; Intermetallic; Isothermal processes; Resistance; Soldering; Thick films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), Proceedings of the 2014 37th International Spring Seminar on
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.1109/ISSE.2014.6887580
  • Filename
    6887580