• DocumentCode
    1794857
  • Title

    Stability of LTCC substrates in high frequency area after accelerated aging tests

  • Author

    Rovensky, Tibor ; Pietrikova, Alena ; Ruman, Kornel ; Vehec, Igor

  • Author_Institution
    Dept. of Technol. in Electron., Tech. Univ. of Kosice, Kosice, Slovakia
  • fYear
    2014
  • fDate
    7-11 May 2014
  • Firstpage
    221
  • Lastpage
    224
  • Abstract
    Aim of this paper is to investigate influence of accelerated ageing on dielectric properties of Low Temperature Co-fired Ceramic (LTCC) substrates with microstrip structure. According to the previous work of Pietrikova et. al (2013), narrow-band notch filter from 2.4 GHz to 2.5 GHz, for minimalizing impact of Wi-Fi signal on UWB radar systems, was designed and fabricated using two different LTCC substrates´ types (DuPont GreenTape 951 and DuPont GreenTape 9K7). All filters were exposed to temperature loads, measured before and after each part of accelerated aging tests. Two types of aging test were chosen: “HTOL” (High Temperature Operation Life) and temperature cycling test. LTCC substrates´ stability were derived from the changes in frequency domain characteristic obtained from measurements by Vector Network Analyser (VNA) up to 12 GHz. Results shown that there is no significant difference in stability of DuPont GreenTape 951 and DuPont GreenTape 9K7 loaded by HF and thermal stress.
  • Keywords
    ageing; ceramics; dielectric properties; life testing; microstrip filters; notch filters; substrates; waveguide filters; DuPont GreenTape 951; DuPont GreenTape 9K7; LTCC substrate stability; UWB radar system; Wi-Fi signal; accelerated aging tests; dielectric properties; frequency 2.4 GHz to 2.5 GHz; high frequency area; low temperature cofired ceramic substrates; microstrip structure; narrow band notch filter; vector network analyser; Green products; Microstrip; Microstrip filters; Substrates; Temperature; Temperature measurement; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), Proceedings of the 2014 37th International Spring Seminar on
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.1109/ISSE.2014.6887597
  • Filename
    6887597