Title :
Bit error rate measurements of all-optical flip-flop operations using a 1.55-μm polarization bistable VCSEL
Author :
Hayashi, Daigo ; Takahashi, Hiroki ; Katayama, Takeo ; Kawaguchi, Hitoshi
Author_Institution :
Grad. Sch. of Mater. Sci., Nara Inst. of Sci. & Technol., Ikoma, Japan
Abstract :
We measured the bit error rate (BER) of all-optical flip-flop operations including an AND gate functionality by using a 1.55-μm polarization bistable VCSEL. Good BER performances were obtained by optical input pulses with low powers.
Keywords :
error statistics; flip-flops; laser cavity resonators; light polarisation; logic gates; optical logic; surface emitting lasers; AND gate functionality; BER performances; all-optical flip-flop operations; bit error rate measurements; optical input pulses; polarization bistable VCSEL; wavelength 1.55 mum; Bit error rate; Flip-flops; Logic gates; Optical bistability; Optical polarization; Optical pulses; Vertical cavity surface emitting lasers;
Conference_Titel :
Optical Fibre Technology, 2014 OptoElectronics and Communication Conference and Australian Conference on
Conference_Location :
Melbourne, VIC
