Title :
Custom design of pinned photodiodes in standard CMOS technologies for time-of-flight sensors
Author :
Illade-Quinteiro, J. ; Brea, V.M. ; Lopez, Pierre ; Cabello, D. ; Domenech-Asensi, G.
Author_Institution :
Centro de Investig. en Tecnoloxias da Informacion (CITIUS), Univ. of Santiago de Compostela, Santiago de Compostela, Spain
Abstract :
In this paper two different structures for custom design of pinned photodiodes in standard CMOS technologies are presented and analyzed in terms of dark current.
Keywords :
CMOS integrated circuits; dark conductivity; photodiodes; time of flight spectra; custom design; dark current; pinned photodiodes; standard CMOS technologies; time-of-flight sensors; CMOS integrated circuits; CMOS technology; Dark current; Junctions; Photodiodes; Semiconductor device modeling; Standards;
Conference_Titel :
Cellular Nanoscale Networks and their Applications (CNNA), 2014 14th International Workshop on
Conference_Location :
Notre Dame, IN
DOI :
10.1109/CNNA.2014.6888603
