Title :
Error value driven fault analysis attack
Author :
Yoshikawa, Masatoshi ; Goto, Hiromi ; Asahi, Koichiro
Author_Institution :
Dept. of Inf. Eng., Meijo Univ., Nagoya, Japan
fDate :
June 30 2014-July 2 2014
Abstract :
The advanced encryption standard (AES) has been sufficiently studied to confirm that its decryption is computationally impossible. However, its vulnerability against fault analysis attacks has been pointed out in recent years. To verify the vulnerability of electronic devices in the future, into which cryptographic circuits have been incorporated, fault Analysis attacks must be thoroughly studied. The present study proposes a new fault analysis attack method which utilizes the tendency of an operation error due to a glitch. The present study also verifies the validity of the proposed method by performing evaluation experiments using FPGA.
Keywords :
cryptography; field programmable gate arrays; AES; advanced encryption standard; cryptographic circuits; error value driven fault analysis attack method; Ciphers; Circuit faults; Encryption; Equations; Field programmable gate arrays; Standards; Error value; Fault analysis attacks; Side-channel attack; Tamper resistance;
Conference_Titel :
Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD), 2014 15th IEEE/ACIS International Conference on
Conference_Location :
Las Vegas, NV
DOI :
10.1109/SNPD.2014.6888689