DocumentCode :
1796679
Title :
Product aspect identification: Analyzing role of different classifiers
Author :
Xing Hu ; Manna, Sukanya ; Truong, Brian N.
Author_Institution :
Comput. Sci. Dept., California State Polytech. Univ., Pomona, CA, USA
fYear :
2014
fDate :
9-12 Dec. 2014
Firstpage :
202
Lastpage :
209
Abstract :
With the rapid advancement of eCommerce, it has become a common trend for customers to write reviews about any product they purchase. For certain popular products, such as cell phones, laptops, tablets, the number of reviews can be hundreds or even thousands, making it difficult for potential customers to identify specific aspect based overview of the product (for example, screen, camera, battery etc). This paper studies different classifiers for aspect identification from unlabeled free-form textual customer reviews. Firstly, a multi-aspect classification is proposed to learn implicit and explicit aspect-related context from the reviews for aspect identification, which does not require any manually labeled training data. Secondly, extensive experiments for analyzing the effectiveness of classifiers and feature selection for aspect identification have also been shown. The results of our experiments on smartphone reviews from Amazon show that Support Vector Machine´s accuracy in aspect identification is best, followed by Random Forest and Naive Bayes.
Keywords :
Bayes methods; electronic commerce; learning (artificial intelligence); pattern classification; purchasing; random processes; support vector machines; Amazon; Naive Bayes; aspect identification; classifiers; e-commerce; explicit aspect-related context; feature selection; implicit aspect-related context; multiaspect classification; product aspect identification; random forest; smartphone reviews; support vector machine accuracy; unlabeled free-form textual customer reviews; Batteries; Cameras; Machine learning algorithms; Support vector machines; Training; Training data; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence and Data Mining (CIDM), 2014 IEEE Symposium on
Conference_Location :
Orlando, FL
Type :
conf
DOI :
10.1109/CIDM.2014.7008668
Filename :
7008668
Link To Document :
بازگشت