Title :
Detection of design pattern in class diagram using ontology
Author :
Thongrak, M. ; Vatanawood, W.
Author_Institution :
Dept. of Comput. Eng., Chulalongkorn Univ., Bangkok, Thailand
fDate :
July 30 2014-Aug. 1 2014
Abstract :
The UML class diagram is used to show the structure of a particular system so that the designer can see the overview picture of the system. The design patterns help us solve the anticipated problems of the system design in the software process. It also helps guide the system design to be more flexible and scalable. However, the automatic detection of design patterns is useful as well in order to assess the expected patterns found in the design model. This paper proposes a tool for detecting design pattern in class diagram using ontologies. Our approach exploits the SQWRL rule created in the ontology to reason the structure of each particular design pattern. The number of target design pattern is reported and the related components of the pattern are located correctly.
Keywords :
Unified Modeling Language; object-oriented methods; ontologies (artificial intelligence); SQWRL rule; UML class diagram; automatic detection; design pattern detection; ontologies; software process; Algorithm design and analysis; Context; OWL; Ontologies; Software design; Unified modeling language; Class Diagram; Design Pattern; Ontology; SQWRL;
Conference_Titel :
Computer Science and Engineering Conference (ICSEC), 2014 International
Conference_Location :
Khon Kaen
Print_ISBN :
978-1-4799-4965-6
DOI :
10.1109/ICSEC.2014.6978176