Title :
A 0.4V 280-nW frequency reference-less nearly all-digital hybrid domain temperature sensor
Author :
Wenfeng Zhao ; Rui Pan ; Yajun Ha ; Zhi Yang
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
This paper presents a subthreshold frequency reference-less temperature sensor. Compared with the previous designs that rely on external frequency references or excessive analog blocks, this work proposes a novel subthreshold ratioed-current/delay sensor core and hybrid-domain all-digital processing technique, which eliminates the dependence on frequency reference and is scalable to technology feature size. Our sensor has been fabricated in a 65-nm CMOS process and occupies a total area of 0.022mm2. Measurement results from 8 test chips have shown that the maximum inaccuracy is -1.6oC/+1oC across 0oC to 100oC with power consumption of 280-nW at 0.4V.
Keywords :
CMOS integrated circuits; temperature sensors; CMOS process; delay sensor; hybrid domain all-digital processing technique; power 280 nW; size 65 nm; subthreshold frequency reference less temperature sensor; subthreshold ratioed current sensor; temperature 0 degC to 100 degC; voltage 0.4 V; Delays; Frequency-domain analysis; MOS devices; Power demand; Semiconductor device measurement; Temperature measurement; Temperature sensors;
Conference_Titel :
Solid-State Circuits Conference (A-SSCC), 2014 IEEE Asian
Conference_Location :
KaoHsiung
Print_ISBN :
978-1-4799-4090-5
DOI :
10.1109/ASSCC.2014.7008920