Title :
A 50-Gb/s differential transimpedance amplifier in 65nm CMOS technology
Author :
Sang Gyun Kim ; Seung Hwan Jung ; Yun Seong Eo ; Seung Hoon Kim ; Xiao Ying ; Hanbyul Choi ; Chaerin Hong ; Kyungmin Lee ; Sung Min Park
Author_Institution :
Dept. of Electron. Eng., Kwangwoon Univ., Seoul, South Korea
Abstract :
A 50-Gb/s differential transimpedance amplifier is realized in a standard 65nm CMOS process, which exploits asymmetric transformer peaking technique for bandwidth extension and employs a modified regulated-cascode input stage with a shunt-feedback common-source amplifier for differential signaling. Measured results demonstrate 52-dBΩ transimpedance gain, 50-GHz bandwidth for 50fF photodiode capacitance, -12.3dBm sensitivity for 10-12 BER, and 49.2-mW power dissipation from a single 1.2-V supply. To the best of authors´ knowledge, this chip achieves the fastest operation speed among the recently reported gigabit CMOS transimpedance amplifiers. The chip occupies the total area of 1.2×0.8mm2 including pad.
Keywords :
CMOS analogue integrated circuits; differential amplifiers; feedback amplifiers; operational amplifiers; asymmetric transformer peaking technique; bandwidth 50 GHz; bandwidth extension; bit rate 50 Gbit/s; capacitance 50 fF; differential signaling; differential transimpedance amplifier; modified regulated-cascode input stage; photodiode capacitance; power 49.2 mW; shunt-feedback common-source amplifier; size 65 nm; standard CMOS process; transimpedance gain; voltage 1.2 V; Bandwidth; CMOS integrated circuits; CMOS technology; Current measurement; Optical receivers; Semiconductor device measurement; Sensitivity; CMOS; TIA; regulated-cascode; transformer;
Conference_Titel :
Solid-State Circuits Conference (A-SSCC), 2014 IEEE Asian
Conference_Location :
KaoHsiung
Print_ISBN :
978-1-4799-4090-5
DOI :
10.1109/ASSCC.2014.7008934