Title :
PCA-based denoising of Sensor Pattern Noise for source camera identification
Author :
Ruizhe Li ; Yu Guan ; Chang-Tsun Li
Author_Institution :
Dept. of Comput. Sci., Univ. of Warwick, Coventry, UK
Abstract :
Sensor Pattern Noise (SPN) has been proved to be an inherent fingerprint of the imaging device for source identification. However, SPN extracted from digital images can be severely contaminated by scene details. Moreover, SPN with high dimensionality may cause excessive time cost on calculating correlation between SPNs, which will limit its applicability to the source camera identification or image classification with a large dataset. In this work, an effective scheme based on principal component analysis (PCA) is proposed to address these two problems. By transforming SPN into eigenspace spanned by the principal components, the scene details and trivial information can be significantly suppressed. In addition, due to the dimensionality reduction property of PCA, the size of SPN is greatly reduced, consequently reducing the time cost of calculating similarity between SPNs. Our experiments are conducted on the Dresden database, and results demonstrate that the proposed method outperforms could achieve the state-of-art performance in terms of the Receiver Operating Characteristic (ROC) curves while reducing the dimensionality of SPN.
Keywords :
cameras; digital forensics; eigenvalues and eigenfunctions; image classification; image denoising; principal component analysis; Dresden database; PCA-based denoising; SPN; digital images; dimensionality reduction; eigenspace; image classification; imaging device fingerprint; principal component analysis; receiver operating characteristic curves; sensor pattern noise; source camera identification; Cameras; Correlation; Digital images; Forensics; Image reconstruction; Noise; Principal component analysis; Digital forensics; PCA; Photo Response Non-Uniformity noise; Sensor pattern noise; Source camera identification; image classification;
Conference_Titel :
Signal and Information Processing (ChinaSIP), 2014 IEEE China Summit & International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4799-5401-8
DOI :
10.1109/ChinaSIP.2014.6889280