DocumentCode :
1797781
Title :
EEG-based emotion recognition using discriminative graph regularized extreme learning machine
Author :
Jia-Yi Zhu ; Wei-Long Zheng ; Yong Peng ; Ruo-Nan Duan ; Bao-Liang Lu
Author_Institution :
Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2014
fDate :
6-11 July 2014
Firstpage :
525
Lastpage :
532
Abstract :
This study aims at finding the relationship between EEG signals and human emotional states. Movie clips are used as stimuli to evoke positive, neutral and negative emotions of subjects. We introduce a new effective classifier named discriminative graph regularized extreme learning machine (GELM) for EEG-based emotion recognition. The average classification accuracy of GELM using differential entropy (DE) features on the whole five frequency bands is 80.25%, while the accuracy of SVM is 76.62%. These results indicate that GELM is more suitable for emotion recognition than SVM. Additionally, the accuracies of GELM using DE features on Beta and Gamma bands are 79.07%, 79.93% respectively. This suggests that these two bands are more relevant to emotion. The experimental results indicate that the EEG patterns for emotion are generally stable among different experiments and subjects. By using minimal-redundancy-maximal-relevance (MRMR) algorithm and correlation coefficients to select effective features, we get the distribution of top 20 subject-independent features and build a manifold model to monitor the trajectory of emotion changes with time.
Keywords :
electroencephalography; emotion recognition; graph theory; learning (artificial intelligence); medical signal processing; DE features; EEG patterns; EEG signals; EEG-based emotion recognition; GELM; MRMR algorithm; correlation coefficients; differential entropy features; discriminative graph regularized extreme learning machine; human emotional states; minimal-redundancy-maximal-relevance algorithm; subject-independent features; Accuracy; Brain modeling; Electroencephalography; Emotion recognition; Support vector machines; Testing; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks (IJCNN), 2014 International Joint Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-6627-1
Type :
conf
DOI :
10.1109/IJCNN.2014.6889618
Filename :
6889618
Link To Document :
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