DocumentCode :
1797862
Title :
Classification with rejection based on various SVM techniques
Author :
Homenda, Wladyslaw ; Luckner, Marcin ; Pedrycz, Witold
Author_Institution :
Fac. of Math. & Inf. Sci., Warsaw Univ. Technol., Warsaw, Poland
fYear :
2014
fDate :
6-11 July 2014
Firstpage :
3480
Lastpage :
3487
Abstract :
The task of identifying native and foreign elements and rejecting foreign ones in the pattern recognition problem is discussed in this paper. Such the task is a nonstandard aspect of pattern recognition, which is rarely present in research. In this paper, ensembles of support vector machines solving two-classes and one-class problems are employed as classification tools and as basic tools for rejecting of foreign elements. Evaluation of quality of classification and rejection methods are proposed in the paper and finally some experiments are performed in order to illustrate acquainted terms and methods.
Keywords :
pattern classification; support vector machines; SVM technique; classification method; classification tools; foreign element identification; foreign element rejection; native element identification; pattern recognition problem; rejection method; support vector machines; Biomedical imaging; Kernel; Pattern recognition; Sensitivity; Standards; Support vector machines; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks (IJCNN), 2014 International Joint Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-6627-1
Type :
conf
DOI :
10.1109/IJCNN.2014.6889655
Filename :
6889655
Link To Document :
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