Title :
On optimal wavelet bases for classification of skin lesion images through ensemble learning
Author :
Surowka, Grzegorz ; Ogorzalek, Maciej
Author_Institution :
Fac. of Phys., Astron. & Appl. Comput. Sci., Jagiellonian Univ., Kraków, Poland
Abstract :
In order to recognize early symptoms of melanoma, the fatal cancer of the skin, systems for computer aided melanoma diagnosis have been developed for years. In this work we analyze an ensemble-based binary classifier for discriminating melanoma from dysplastic nevus utilizing wavelet-based features of the dermatoscopic skin lesion images. The multiresolution decomposition of the dermatoscopy images is done through wavelet packets. We search for the optimal wavelet base maximizing the quality of the classifier in terms of AUC (Area Under Curve) for models optimized by some common quality measures: accuracy, precision, Fl-score, FP-rate, specificity, BER and recall. Within the statistics of our experiments reverse bi-orthogonal wavelet rbio 3.1 makes the best wavelet model of melanoma.
Keywords :
cancer; feature extraction; image classification; learning (artificial intelligence); medical image processing; skin; wavelet transforms; AUC; BER measure; FP-rate; Fl-score; accuracy measure; area under curve; computer aided melanoma diagnosis; dermatoscopic skin lesion images; dermatoscopy image decomposition; dysplastic nevus; ensemble learning; ensemble-based binary classifier; melanoma symptoms; optimal wavelet base; precision measure; recall measure; reverse bi-orthogonal wavelet; skin cancer; skin lesion image classification; specificity measure; wavelet packets; wavelet-based features; Data models; Malignant tumors; Skin; Training; Wavelet analysis; Wavelet packets;
Conference_Titel :
Neural Networks (IJCNN), 2014 International Joint Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-6627-1
DOI :
10.1109/IJCNN.2014.6889680