Title :
A maximal coverage entropy based reduct for classification
Author :
Oudomying, Suntana ; Chanvarasuth, Pisit
Author_Institution :
Sch. of Manage. Technol., Thammasat Univ., Pathumthani, Thailand
fDate :
July 30 2014-Aug. 1 2014
Abstract :
The paper proposes a new scoring metric to rank a reduct. Our technique investigates each reduct against the decision table data for ranking by coupling entropy score and coverage score. We compared our work result to a result from a feature selection technique in Weka. The result showed the model learned from our selected features yielded higher accuracy.
Keywords :
decision tables; entropy; feature selection; pattern classification; Weka; coverage score; data classification; decision table data; entropy score; feature selection technique; maximal coverage entropy based reduct; reduct ranking; scoring metric; Computer science; Data models; Entropy; Measurement; Neural networks; Rough sets; Wavelet transforms; Data Preprocessing; Feature Selection; Ranking; Reducts; Rough Sets;
Conference_Titel :
Computer Science and Engineering Conference (ICSEC), 2014 International
Conference_Location :
Khon Kaen
Print_ISBN :
978-1-4799-4965-6
DOI :
10.1109/ICSEC.2014.6978228
