DocumentCode :
1799025
Title :
Light effect characterization of ISFET based pH sensor with Si3N4 gate insulator
Author :
Noh, Nurul Izzati Mohammad ; Yusof, Khairul Aimi ; Abdullah, Ali Zaini ; Herman, Sukreen Hana ; Fazlida, Wan ; Abdullah, Hanim
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. MARA Shah Alam, Shah Alam, Malaysia
fYear :
2014
fDate :
7-8 April 2014
Firstpage :
82
Lastpage :
87
Abstract :
The performance of ISFET based pH sensor device in testing and characterization process of light effect has been successfully done. The experimental setup was carried out by Agilent Technologies B1500A Semiconductor Device Analyzer with an additional readout interfacing circuit (ROIC). This paper reports the electrical characterization test i.e. current-voltage (I-V) measurement and sensitivity, drift and hysteresis test of the fabricated sensor. The I-V measurement was done in light and dark conditions but the drift and hysteresis characterizations were done in dark condition to avoid the influence of light. This experiment used the standard buffer solution to observe the characteristic of the device. From the experimental result, it found that the sensor performance has a light effect due to the light exposure. Drift and hysteresis test using the ROIC showed a good performance in term of the durability, reliability and accuracy of the sensor. The discussion of the light effect on the sensor performance is presented.
Keywords :
chemical sensors; durability; hysteresis; ion sensitive field effect transistors; pH measurement; readout electronics; reliability; silicon compounds; Agilent Technologies B1500A semiconductor device; I-V measurement; ISFET based pH sensor device; ROIC; Si3N4; current-voltage measurement; current-voltage sensitivity; dark conditions; drift test; durability; electrical characterization test; gate insulator; hysteresis test; ion sensitive field effect transistor; light effect characterization process; readout interfacing circuit; reliability; Current measurement; Electrodes; Hysteresis; Logic gates; Semiconductor device measurement; Sensitivity; Threshold voltage; Ion-sensitive field effect transistor (ISFET); drift; hysteresis; light effect; readout interfacing circuit (ROIC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Applications and Industrial Electronics (ISCAIE), 2014 IEEE Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4799-4352-4
Type :
conf
DOI :
10.1109/ISCAIE.2014.7010214
Filename :
7010214
Link To Document :
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