Title :
Optoelectronic properties of ZnO:In thin films by ultrasonic spray pyrolysis
Author :
Biswal, R.R. ; Maldonado, Andres ; Olvera, M. de la L.
Author_Institution :
Dept. de Ing. Electr., CINVESTAV-IPN, Mexico City, Mexico
fDate :
Sept. 29 2014-Oct. 3 2014
Abstract :
Transparent and conductive Indium-doped zinc oxide (ZnO:In) thin films were deposited on glass substrates by the ultrasonic spray pyrolysis technique. ZnO:In thin films were prepared by mixing 0.2M zinc acetate and 0.2M indium sulphate dissolved in a mixture of water, acetic acid and methanol. Indium sulphate which acts as the In source was chosen at three different atomic concentrations, namely, 1, 2, and 3 at. % and the films were deposited at a temperature ranging between 385 °C and 430 °C. The dependence of the electrical and optical properties on the substrate temperature and the dopant concentration was studied. Electrical resistivity as low as 1.6×10-3 Ωcm, electron mobility around 11 cm2/(V-s), carrier concentration in the range 4.96-8.98 ×1020 cm-3, and an optical transmittance of about 80 % was achieved for 3 at. % ZnO:In thin films.
Keywords :
II-VI semiconductors; carrier density; doping profiles; electrical resistivity; electron mobility; indium; infrared spectra; pyrolysis; semiconductor thin films; spray coating techniques; visible spectra; wide band gap semiconductors; zinc compounds; SiO2; ZnO:In; atomic concentrations; carrier concentration; conductive indium-doped zinc oxide thin films; dopant concentration; electrical properties; electrical resistivity; electron mobility; glass substrates; indium sulphate; optical properties; optical transmittance; optoelectronic properties; substrate temperature; temperature 385 degC to 430 degC; transparent thin films; ultrasonic spray pyrolysis; Conductivity; Indium; Optical films; Photonic band gap; Substrates; Zinc oxide; tco; thin films; ultrasonic spray; zinc oxide;
Conference_Titel :
Electrical Engineering, Computing Science and Automatic Control (CCE), 2014 11th International Conference on
Conference_Location :
Campeche
Print_ISBN :
978-1-4799-6228-0
DOI :
10.1109/ICEEE.2014.6978325