Title :
A Generic Framework for Scan Capture Power Reduction in Test Compression Environment
Author :
Liu, Xiao ; Yuan, Feng ; Xu, Qiang
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin
Abstract :
This work proposes a generic framework for reducing scan capture power in test compression environment. Using the entropy of the test set to measure the impact of capture power-aware X-filling on the potential test compression ratio, the proposed method is able to keep capture power under a safe limit with little loss in test compression ratio.
Keywords :
integrated circuit testing; power consumption; generic framework; integrated circuits testing; potential test compression ratio; power-aware X-filling; scan capture power reduction; test compression environment; Circuit testing; Computer science; Entropy; Flowcharts; Hamming distance; Integrated circuit testing; Power engineering and energy; Power engineering computing; Probability; Reliability engineering;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700699
