• DocumentCode
    1800284
  • Title

    Test Quality Improvement with Timing-aware ATPG: Screening small delay defect case study

  • Author

    Chang, C.-J.J. ; Kobayashi, Takeo

  • Author_Institution
    DTV Div., AMD, Markham, ON
  • fYear
    2008
  • fDate
    28-30 Oct. 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Silicon results from 512 K sample chips tested with Timing-aware ATPG are presented. We had 4040 unique detections from 86 K timing-aware pattern. We will also show ATPG results and estimate the quality impact of timing-aware ATPG.
  • Keywords
    automatic test pattern generation; ATPG; small delay defect; test quality improvement; timing aware; Application specific integrated circuits; Automatic test pattern generation; Delay; Failure analysis; Pattern analysis; Production; Silicon; Surface-mount technology; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700702
  • Filename
    4700702
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1800284