Title :
Overview of a High Speed Top Side Socket Solution
Author :
Stewart, John ; Animashaun, Temitope
Author_Institution :
Intel Corp., Hillsboro, OR
Abstract :
A topside contactor design is described. Measured results are provided demonstrating successful operation of the topside contactor solution.
Keywords :
automatic test equipment; contactors; high-speed integrated circuits; integrated circuit design; integrated circuit testing; IC package; high speed top side socket; intersymbol interference; synchronous ATE tester interface; topside contactor design; Attenuation; Connectors; Contacts; Delay; Integrated circuit packaging; Intersymbol interference; Pins; Product development; Sockets; Testing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700705
