• DocumentCode
    1800363
  • Title

    Improving the Accuracy of Test Compaction through Adaptive Test Update

  • Author

    Biswas, Sounil ; Blanton, R. D Shawn

  • Author_Institution
    Nvidia Corp., Santa Clara, CA
  • fYear
    2008
  • fDate
    28-30 Oct. 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    To mitigate fluctuations in the accuracy of test compaction, we propose to periodically verify this accuracy using stratified samples and adaptively update the models when it degrades below some acceptable limit. Application to an in-production accelerometer demonstrates the feasibility of this methodology.
  • Keywords
    accelerometers; adaptive test update; fluctuation mitigation; in-production accelerometer; stratified samples; test compaction; Accelerometers; Accuracy; Compaction; Degradation; Manufacturing; Predictive models; Process control; Sampling methods; System testing; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700706
  • Filename
    4700706
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1800363