Title :
Improving the Accuracy of Test Compaction through Adaptive Test Update
Author :
Biswas, Sounil ; Blanton, R. D Shawn
Author_Institution :
Nvidia Corp., Santa Clara, CA
Abstract :
To mitigate fluctuations in the accuracy of test compaction, we propose to periodically verify this accuracy using stratified samples and adaptively update the models when it degrades below some acceptable limit. Application to an in-production accelerometer demonstrates the feasibility of this methodology.
Keywords :
accelerometers; adaptive test update; fluctuation mitigation; in-production accelerometer; stratified samples; test compaction; Accelerometers; Accuracy; Compaction; Degradation; Manufacturing; Predictive models; Process control; Sampling methods; System testing; Training data;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700706
