• DocumentCode
    1800397
  • Title

    On-chip Timing Uncertainty Measurements on IBM Microprocessors

  • Author

    Franch, R. ; Restle, P. ; James, N. ; Huott, W. ; Friedrich, J. ; Dixon, R. ; Weitzel, S. ; Van Goor, K. ; Salem, G.

  • Author_Institution
    IBM Res., Yorktown Heights, NY
  • fYear
    2008
  • fDate
    28-30 Oct. 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Timing uncertainty in microprocessors is comprised of several sources including PLL jitter, clock distribution skew and jitter, across chip device variations, and power supply noise. The on-chip measurement macro called SKITTER (SKew+jITTER) was designed to measure timing uncertainty from all combined sources by measuring the number of logic stages that complete in a cycle. This measure of completed delay stages has proven to be a very sensitive monitor of power supply noise, which has emerged as a dominant component of timing uncertainty. This paper describes the Skitter measurement experiences of several IBM microprocessors including PPC970MP, XBOX360TM, CELL Broadband EngineTM, and POWER6TM microprocessors running different workloads.
  • Keywords
    clocks; measurement uncertainty; microprocessor chips; phase locked loops; time measurement; timing jitter; IBM microprocessor; PLL jitter; SKITTER design; across chip device variations; clock distribution skew; on-chip timing uncertainty measurement; power supply noise; Clocks; Logic design; Logic devices; Measurement uncertainty; Microprocessors; Phase locked loops; Power measurement; Power supplies; Semiconductor device measurement; Timing jitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700707
  • Filename
    4700707