DocumentCode :
1800440
Title :
The influence of the early failure on the life distribution of sensors
Author :
Zhen, Zhou ; Lijie, Wang ; Zhongwen, Guo ; Jianying, Guo
Author_Institution :
Harbin Univ. of Sci. & Technol., China
fYear :
1999
fDate :
1999
Firstpage :
159
Abstract :
In the paper, life test data of humidity sensitive components were dealt with using a computer from the meaning of life distribution. The life distribution curve and the initial estimate of the corresponding parameters were also inferred. The influence of early failures on the life distribution for a sensor was emphasized and the reliability parameters were further estimated precisely according to the corresponding situation
Keywords :
failure analysis; life testing; reliability; sensors; statistical analysis; early failure; humidity sensitive components; life distribution curve; life test data; reliability parameters estimation; sensor life distribution; Consumer electronics; Distributed computing; Electronic equipment testing; Exponential distribution; Failure analysis; Humidity; Life testing; Performance evaluation; Scattering; Sensor phenomena and characterization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicle Electronics Conference, 1999. (IVEC '99) Proceedings of the IEEE International
Conference_Location :
Changchun
Print_ISBN :
0-7803-5296-3
Type :
conf
DOI :
10.1109/IVEC.1999.830651
Filename :
830651
Link To Document :
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